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4380-IH
We, Tesec is now introducing the new strip frame testing handler model 4380 that is for ambient and hot temperature testing without singular the SOIC devices attached in matrix format on the strip frame. The device positions(x y z θ) are compensated before testing by visual alignment function, so that high accuracy of the device positioning and probe-pin contactor pressure for all of the devices are maintained as firm for stable testing and high indexing.
| Specifications |
| Model |
4380-IH |
| Applicable device |
SOIC Type |
| Applicable strip size |
Less than 250 x 70mm |
| Applicable magazine size |
W175～260.3mm、D40～80.3mm、H250～340mm |
| Test station |
Multi-parallel |
| Contact method |
Pogo-pin or specified contactor |
| supply magazine capacity |
2 pcs |
| stock magazine capacity |
3 pcs |
FEATURES
High throughput
High withstand load and high thrust table
LOT control by barcode and 2-D code reder
Easy device type exchange only by few special parts exchange and screen setting
Auto-cleaning function unit is installed to clean the socket at any desired timing
S2/S8 regulation compliance
SEMI G85 compliance
SECS/GEM compliance