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商品詳細介紹Product Introduction
381-TT/P
The 381-TT/P is a high performance test system which covers wide range of discrete semiconductor devices from small signal devices to power devices. As the most popular tester in the world corresponding to the steady progress of semiconductor devices in specifications and performance, 381-TT/A has received high estimation in its reliability.
| Specifications |
|
Standard device
|
Transistor, Diode, Zener Diode |
|
Optional device
|
FET, Dual-gate FET, Thyristor, Voltage Regulator, Opto device, Array device, IGBT |
|
Test station
|
5 |
|
Voltage/Current
|
1kV/20A |
|
Extended test capability
|
5kV & 1200A option |
|
Pinout
|
3 pins |
|
Maximum bias conditions
|
2-bias |
| High voltage option |
3kV/4kV/5kV |
|
High current option
|
200A/600A/1200A |
|
Data display
|
4-digit |
|
Test plan
|
250 |
|
Sort plan
|
250 |
|
Test method
|
TBB/TBS |
|
Test time
|
380μs-9.99s |
|
Relay time
|
3ms |
|
CPU time
|
0.64-4.0ms/test |
|
Control CPU
|
68000 |
|
Operating system
|
Microsoft(R) Windows(R) XP |
|
Host PC interface
|
RS-232C |
|
Electrical power
|
AC100-240V 550VA |
|
Dimension (WxDxH)
|
540x750x1010mm |
|
Weight
|
140kg |
|
Previous model
|
881-TT0 |
|
Options
|
Software: Host link, Wafer mapping, Data file editor, Counter editor, Data analysis package, Excel data file converter |
FEATURES
1kV/20A Capability in Main Frame
Parallel Test Capability (381-TT/P)
Test Method
TBB : Test By Branch
TBS : Test By Sort
Optional Software
Host Link
Data Analysis
Wafer Mapping