The 351-TT/P test system performs parallel testing of standard discrete devices upto 5 pins. The voltage and current ratings of the tester mainframe is 2KV and 50A. It consists of 2 parallel test subsystems, each of which can be multiplexed to 4 manual/handler/prober stations for high volume production testing.
| Specifications |
|
Standard device
|
IGBT, Transistor, Diode, Zener Diode, FET, Thyristor, Voltage Regulator |
|
Optional device
|
Opto device, Dual-gate FET, Current Sense MOSFET, Hall-effect device |
|
Test station
|
2 parallel x 4 test stations each |
|
Voltage/Current
|
2kV & 50A |
|
Extended test capability
|
4kV & 600A |
|
Pinout
|
5 |
|
Maximum bias conditions
|
4-bias |
| High voltage option |
3kV/4kV |
|
High current option
|
200A/600A/1200A |
|
Data display
|
4-digit |
|
Test plan
|
500 |
|
Sort plan
|
250 |
|
Test method
|
TBB/TBS |
|
Test time
|
380μs-9.99s |
|
Relay time
|
3ms |
|
Control CPU
|
68000 |
|
Operating system
|
Microsoft(R) Windows(R) XP |
|
Host PC interface
|
RS-232D |
|
DC tester interface
|
GP-IB |
|
Electrical power
|
AC100-240V 1kVA |
|
Dimension (WxDxH)
|
540x750x2000mm |
|
Previous model
|
341-TT/P |
|
Options
|
Software: Host link, Data analysis package, Excel data file converter |
FEATURESdrastic reduction in test time by parallel testing
testing of discrete devices up to 5 pins
4 bias setting
automatic self diagnostic function for measurement accuracy
software based on Windows