- PRODUCTS商品櫥窗
商品明細
商品詳細介紹Product Introduction
3430-SW
| Specifications |
| |
Switching Time Test |
I-Short Test |
trr Test |
| VCE |
30 ～ 1,500 V ( 1V Step) |
30 ～ 1,500V (1V Step) |
30 ～ 1,500V (1V Step) |
| IC |
1 ～ 300 A(1A Step) |
1 ～ 1,000A (1A Step) |
1 ～ 300A (1A Step) |
| IC Trip |
1 ～ 300 A(1A Step) |
－ |
1 ～ 300A (1A Step) |
| IC max |
1 ～ 1,000A(1A Step) |
1 ～ 1,000A (1A Step) |
1 ～ 1,000A (1A Step) |
| VGE |
±30.0V (0.1V Step) |
±30.0V (0.1V Step) |
±30.0V (0.1V Step) |
| RG |
1 ～ 250Ω(1Ω Step) |
1 ～ 250Ω (1Ω Step) |
1 ～ 250Ω (1Ω Step) |
| Pulse |
Single /Double |
Single |
Double |
| T1 |
000.1μ ～ 50.0 ms(0.1μs Step) |
000.1 ～ 50.0μs (0.1μs Step) |
000.1μ ～ 50.0 ms (0.1μs Step) |
| T2 |
000.1 ～ 999.9μs(0.1μs Step) |
－ |
000.1 ～ 999.9μs (0.1μs Step) |
| T3 |
000.1 ～ 999.9μs(0.1μs Step) |
－ |
000.1 ～ 999.9μs (0.1μs Step) |
| R Load |
Plug in |
－ |
－ |
| l Load |
Plug in |
－ |
Plug in |
| Pre check |
GS Short /Open /Short /Leak |
GS Short /Open /Short /Leak |
Vdsf(D.U.T) /GS Short /Open /Short /Leak (Dummy) |
| Post check |
Leak |
Leak |
Leak (Dummy) |
| Test Item |
td(on) /td(off) /ton /toff /tr
/tf /Eon /Eoff /IC0
|
Icp |
trr /trr1 /trr2 /Irr /Qrr /Qrr1 /Qrr2 /IF /dIF /dt /dI(rec)M /dt |
| Test Time |
160 ms |
140 ms |
170 ms |
| DSO |
LT364 (LeCroy) |
－ |
LT364 (LeCroy) |
Dynamic Test System 3430-SW measures dynamic characteristics of IGBT/MOSFET devices at high speed. Maximum of 4 parallel measurement is available by connecting the 3430-SW mainframe to four 3432-HB test heads and a total of four 3433-HB or 3434-HB or 3435-HB test stations. One PC controls the whole system.