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4334-KT
The 4334-KT tester measures thermal resistance characteristics of transistors, diodes, MOSFETs and IGBTs. It can also measure the safe operating area of these devices. This tester is very effective in detecting die bonding failure. The tester is equipped with device protection circuit to prevent device damage at the start of an avalanche.
| Specifications |
| System component |
ˋ4334-KT Test unit |
| Standard device |
Transistor, Diode, MOSFET, IGBT |
| Voltage/Current |
200V/10A 300W |
| Power rating |
300W |
| Data display |
4-digit |
| Test programming |
key switches or external pc |
| Pretest |
contact check, B-E open/short tests |
| Forcing voltage VCB/VDS |
001-200V |
| Forcing current IE/IDS |
0.01-10.00A |
| Sensing current IM |
1-100mA |
| Voltage limit V-Gate |
1.0-20.0V |
| Power forcing time PT |
300μs-400ms |
| Delay time DT |
10-999μs |
| Upper limit/Lower limit |
000.0-999.9mV/0000-9999mV |
| Measurement range |
Vbe1/Vds1/Vgs1/Vf1: 0000-9999mV ΔVbe/ΔVds/ΔVgs/ΔVf: 000.0-999.9mV/0000-9999mV |
| Test result display |
Vbe1/Vds1/Vgs1/Vf1 ΔVbe/ΔVds/ΔVgs/ΔVf |
| Judgment display |
pass, low, high, aval, error, osc, open, short, contf |
| Binning |
Max.5-bin |
| Host PC interface |
RS-232C |
| DC tester interface |
GP-IB |
| Electrical power |
AC100-120V 550VA |
| Dimension (WxDxH) |
4334-KT: 431x500x235mm 9615-PU: 431x500x235mm |
| Weight |
9614-KT: 32kg 9615-PU: 30kg |
| Options |
9216-HB, 9917-HB, 3317-HB |
FEATURES
LCD 42 columns and 16 rows with backlight
oscillation detection and contact check for increased reliability of test result
effective in detecting die-bonding failure
external control by RS-232C or GP-IB
oscillation detection function prevents measurement errors and mis-binning