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商品詳細介紹Product Introduction
3042-Q
Thel Gate Charge Tester 3042-Q measures the gate charge of MOSFET.
This tester is equipped with CONTACT CHECK and OPEN / SHORT test functions, and performs high volume production testing.
Specifications |
Parameter |
Range |
Resolution |
Unit |
QGS1 |
0.5 to 499.9 |
0.1 |
nC |
QGS2 |
0.5 to 499.9 |
0.1 |
nC |
QG-SWITCH |
0.5 to 499.9 |
0.1 |
nC |
QG-CONTROL |
0.5 to 499.9 |
0.1 |
nC |
QG-SYNC |
0.5 to 499.9 |
0.1 |
nC |
QOSS |
0.5 to 499.9 |
0.1 |
nC |
CDV/DT |
0.1 to 499.9 |
0.1 |
nC |
RDSON |
0.001 to 1.999 |
0.001 |
Ω |
Conditions |
Range |
Resolution |
Unit |
Drain voltage (Vds) |
5.0 to 60.0 |
0.25 |
V |
Drain current (Id max) |
2.0 to 50.0 |
0.2 |
A |
Vg max |
2.0 to 15.0 |
0.1 |
V |
Id@Vth |
200.0 to 999.9 |
50 |
μA |
FEATURES
Single or dual die MOSFET device test
Standard Tester / Handler interface
Kelvin test with 20mA constant current
Device Functional pre-test [Open/short]
Auto or Manual test operation
User-friendly interface, cataloging, program editor, and test summary
Networking capability (option)
Simple calibration procedure.
Fully programmable Forcing conditions and Parameters
High Drain current capability up to 50 A